Vetal solution for White PP impurity in cotton

Vetal-pic-1

One of the biggest problems faced by cotton yarn spinners today is the presence of white polypropylene materials as a very objectionable impurity. Generally known as White PP and being resistant to most of the scanning systems, it finds its way from raw cotton upto the yarn stage. A single strand of HDPE bag fragment of 200 mm x 3 mm, if left undetected before the carding stage, gets pulverised to hundreds of shreds polluting the entire yarn process.

Unless controlled these small strands are extremely difficult to identify and remove in the yarn stage. Even if they are identified by expensive solutions available for defect/ PP clearing in the winding stage, the number of removals has to be restricted as a compromise to production loss and yarn strength, leaving users helpless.

Such small strands in yarn get exposed in the finished fabric gray or colored, spoiling the appearance and attracting penalty of increasing wastage by unnecessary cutting of the cloth for garment making. Inability to keep trail of these integrated impurities further compounds fabric buyers’/manufacturers’ problems, forcing them to deploy multiple fabric inspection machines with human scrutiny through magnifying lenses – an attempt in vain where the picking efficiency is very insignificant. It destroys buyer confidence, in addition to loss of the brand image.

Vetal with its 30-year experience in textile foreign particle detection, successfully launched YUVIS in Texfair 2013 which is now part of the blowroom in leading export and high quality cotton yarn spinners in Tamil Nadu and other States.

Under high intensity UV cameras, glittering and fluorescent PP offers optimum exposure for identification for removal of impurities through proper parameter selection in the HMI machine. Direct focussing, high-speed image processing algorithms and dedicated ejection enable easier detection. Best-in-class with less waste ejection, it has emerged as the most efficient machine in tackling white PP problems.